Publications


PEPITES : A NEW TRANSPARENT PROFILER BASED ON SECONDARY ELECTRONS EMISSION FOR FLASH-RT CHARGED PARTICLE BEAMS.


HIAT2022 - Contributions to the Proceedings

BEAM INSTRUMENTATION, CHALLENGING TOOLS FOR DEMANDING PROJECTS – A SNAPSHOT FROM THE FRENCH ASSIGNED NETWORK

Conference paper is available


Conference paper is also available



  • Patent protecting the PEPITES profiler developed by LLR researchers

“SYSTEME DE CARACTERISATION D’UN FAISCEAU DE PARTICULES CHARGEES ET MACHINE DE PRODUCTION D’UN FAISCEAU DE PARTICULES CHARGEES COMPRENANT UN TEL SYSTEME”

Invention patent 1850979 issued to Ecole polytechnique and CNRS

Patent FR3077646 B1


Exploring radiation hardness of PEPITES, a new transparent charged particle beam profiler
S. Elidrissi-Moubtassim, et al.
Nuclear Inst. and Methods in Physics Research, B (2020) Vol. 466, pp. 8-11
https://doi.org/10.1016/j.nimb.2020.01.003


A new transparent beam profiler based on secondary electrons emission for hadrontherapy charged particles beams
C. Thiebaux, et al.
Physica Medica: European Journal of Medical Physics, Volume 68, 42
https://doi.org/10.1016/j.ejmp.2019.09.149 


Development of a transparent profiler based on secondary electrons emission for charged particle beams
C. Thiebaux, et al.
https://doi.org/10.18429/JACoW-Cyclotrons2019-THB04

Present on our Web:



Find the abstract on the conference website as well as the poster.




Development of an ultra thin beam profiler for charged particle beams
B. Boyer, et al.
Nuclear Inst. and Methods in Physics Research, A (2018)
https://doi.org/10.1016/j.nima.2018.09.134



  • General audience poster